structural evaluation of p-type antimony-bismuth-telluride thin film with annealing temperature using X-ray diffraction technique

Dr. Kafil Mahmood RazeebBSHAYER MESHRD A ALENZY2022-05-192022-05-1930964https://drepo.sdl.edu.sa/handle/20.500.14154/15044structural evaluation of p-type antimony-bismuth-telluride thin film with annealing temperature using X-ray diffraction techniqueThesis