DETERMINISTIC BUILT-IN SELF TEST FOR DIGITAL CIRCUITS.
| dc.contributor.author | AHMAD A. YAMANI | |
| dc.date | 2004 | |
| dc.date.accessioned | 2022-06-01T02:44:22Z | |
| dc.date.available | 2022-06-01T02:44:22Z | |
| dc.degree.department | Ph.D. | |
| dc.identifier.other | 4919 | |
| dc.identifier.uri | https://drepo.sdl.edu.sa/handle/20.500.14154/55304 | |
| dc.language.iso | en_US | |
| dc.publisher | Saudi Digital Library | |
| dc.title | DETERMINISTIC BUILT-IN SELF TEST FOR DIGITAL CIRCUITS. | |
| dc.type | Thesis | |
| sdl.thesis.level | Doctoral | |
| sdl.thesis.source | SACM - United States of America |