Reliability Study of InGaN Micro-Light Emitting Diodes under High Current Density

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dc.contributor.advisorDr. Erdan Gu
dc.contributor.authorAHMAD OWAYEDH A ALTHUMALI
dc.date2014
dc.date.accessioned2022-05-26T18:54:37Z
dc.date.available2022-05-26T18:54:37Z
dc.degree.departmentDr. Erdan Gu
dc.identifier.other33921
dc.identifier.urihttps://drepo.sdl.edu.sa/handle/20.500.14154/32479
dc.publisherSaudi Digital Library
dc.titleReliability Study of InGaN Micro-Light Emitting Diodes under High Current Density
dc.typeThesis
sdl.thesis.levelMaster
sdl.thesis.sourceSACM - United Kingdom

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