Device automation of MBE-LEEM system and modelling of flux overshoot transients in molecular beam epitaxy sources

Abstract

To develop logic and programmes for automation of several instruments in the III-V LEEM system. 2. To model and develop an algorithm for correction of flux overshoot values from source cells during shutter opening, and then simulate the model using LabVIEW. 3. To design, write and test LabVIEW based programmes to automate shutter operations of the source cells, and to verify and validate the algorithm through simulations. 4. To integrate the developed programmes in LabVIEW, for controlling III-V LEEM system. 5. To investigate the nucleation processes for InGaAs in MBE, using LEEM, with the source cells programmed to deliver corrected constant desired flux throughout.