Design, development and evaluation of a laser-induced optical emission spectrometer for remote characterization of solid samples.
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Date
2025
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Publisher
Saudi Digital Library
Abstract
Laser-Induced Breakdown Spectroscopy (LIBS) is a versatile technique for rapid and nondestructive
elemental analysis of solid materials. Its ability to operate under stand-off conditions
makes it highly attractive for applications involving hazardous, moving, or inaccessible
samples. However, optimizing LIBS instrumentation for remote characterization remains
challenging, particularly regarding laser–plasma interaction, light collection efficiency, and
spectral quality.
This Master’s Thesis presents the design, development, and evaluation of two LIBS system
configurations. The setups differed mainly in the laser source employed, while the optical
collection system remained identical. This strategy was intended to address the analysis of
both fixed and moving samples and to provide practical insight into the design and assessment
of stand-off LIBS instrumentation.
The spectrometer components—including laser source, beam delivery optics, fiber-bundle
light collection, spectrometer, and detector—were integrated and tested. The developed system
was applied to galvanized steel (Zn/Fe) samples to demonstrate depth profiling and interfacial
detection capabilities. Additionally, a comparative study between two optical collection
configurations (2-fiber and 19-fiber bundles) was performed to evaluate signal intensity,
stability, and reproducibility under stand-off conditions.
The results confirm that both system configurations enable reliable elemental analysis, with
clear identification of interfacial layers and consistent signal acquisition. These findings highlight
the potential of the proposed LIBS setups as flexible tools for industrial and scientific
applications requiring remote characterization of solid samples.
Description
Keywords
Laser-induced breakdown spectroscopy, stand-off spectroscopy, Laser-induced plasma, Instrumentation, depth profiling, optical fibers.
