New Capabilities for Molecular Surface and in-Depth Analysis with Cluster Secondary Ion Mass Spectrometry

dc.contributor.advisorDr Nicholas Lockyer
dc.contributor.authorHURIYYAH AHMED HUSSAIN ALTURAIFI
dc.date2018
dc.date.accessioned2022-05-29T11:23:35Z
dc.date.available2022-05-29T11:23:35Z
dc.degree.departmentPHYSICAL SCIENCES
dc.identifier.other36882
dc.identifier.urihttps://drepo.sdl.edu.sa/handle/20.500.14154/46458
dc.publisherSaudi Digital Library
dc.titleNew Capabilities for Molecular Surface and in-Depth Analysis with Cluster Secondary Ion Mass Spectrometry
dc.typeThesis
sdl.thesis.levelDoctoral
sdl.thesis.sourceSACM - United Kingdom

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