Studying the Characteristics Of Timepix Family Detectors With Silicon Sensor In Time Over Threshold Mode
Abstract
The Timepix detector family has been calibrated for various energy levels of X-ray sources for the purpose of understanding energy information relating to incoming particles. Studying the energy characteristic response of detector chips can contribute greatly to our understanding of the properties of sensors that can be used for various applications, especially in high-level physics experiments. For this reason, this research studies the characteristics of the Timepix detector family with two types of silicon sensor (standard silicon and LGAD) used in Time-over-Threshold (ToT) mode for measuring the same particles. This is achieved by measuring the ToT count of the pixel in each chip, and then calibrating the detector to reconstruct the spectrum so that its energy values can be obtained. The result obtained from both sensors shows that the charge amplification in the LGAD sensor permits X-ray detection with an improved signal-to-noise ratio compared to what was observed when using the standard silicon as the sensor. Also, the detector with the LGAD sensor was shown to be efficient in detecting low-energy sources, as in Cu (8 keV), whereas the detector with standard silicon could not respond to such low-energy values of X-ray. Therefore, hybrid detectors with LGAD sensors can be used to accurately measure both low- and high-energy sources if properly calibrated, since they offer fast-timing and radiation-hardness properties.