structural evaluation of p-type antimony-bismuth-telluride thin film with annealing temperature using X-ray diffraction technique

dc.contributor.advisorDr. Kafil Mahmood Razeeb
dc.contributor.authorBSHAYER MESHRD A ALENZY
dc.date2016
dc.date.accessioned2022-05-19T16:29:17Z
dc.date.available2022-05-19T16:29:17Z
dc.degree.departmentكيمياء تحليلة
dc.identifier.other30964
dc.identifier.urihttps://drepo.sdl.edu.sa/handle/20.500.14154/15044
dc.publisherSaudi Digital Library
dc.titlestructural evaluation of p-type antimony-bismuth-telluride thin film with annealing temperature using X-ray diffraction technique
dc.typeThesis
sdl.thesis.levelMaster
sdl.thesis.sourceSACM - Ireland

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